JEOL JEM4000FX TEM/STEM
Specifications
Spherical aberration: 1.8mm
Chromatic aberration: 2.2mm
Cathode: LaB6
Pole Piece: AHP40S
Measured resolution at 200 or 400kV
TEM, lattice, gold specimen: 0.14nm
TEM, point, gold specimen: 0.2nm
TEM, optical diffraction of carbon film at
40,000x: 0.35nm
TEM, cryo at -180C, 60 degrees tilt, graphitized
carbon lattice: 0.34nm
STEM, edge-to-edge, gold specimen: 1nm
Five-axis computer-controlled stage
Maximum tilt: +/- 60 degrees
x-y repositioning accuracy: 250nm
Specimen holders
Tilt-rotation
Single-tilt, two specimen
Gatan cryotransfer
Peripherals
Tietz (TVIPS) imaging system
Photometrics cooled, slow-scan CCD camera
Image size: 1024x1024 pixels
Element size: 24 micrometers
Image bits: 12 (stored as 16)
OS-9 VME-based computer with dual i850 array processor
Interfaces with EM and stage computers
On-line power spectrum display and interactive
Fourier filtering
Automatic tomography system
Automatic focussing using beam tilt method
Automatic image centering using electronic image shift
Four user-defined areas on the specimen for full
low-dose imaging
Tracor-Northern TN-5500
Energy-dispersive x-ray microanalysis system with x-ray
mapping capability
Gatan video-rate, intensified CCD camera
For manual focussing and group viewing
SGI workstation
For semi-automated tomography, stereo viewing, image processing using SPIDER,
and Internet access
PC
For keeping user notes
